We're seeking a skilled Scientist with expertise in Dual Beam FIB/SEM technology to play a critical role in advanced microscopy investigations. Join our innovative Dual Beam Analysis team, where you'll work with state-of-the-art microscopy tools to support imaging and materials analysis of client samples.
In this role, you'll prepare high-quality TEM lamella, perform SEM imaging and EDS analysis on FIB cross-sections to support detailed structural, compositional, and failure analysis for clients across diverse industries. You'll also contribute to critical dimension (CD) measurements, process optimization, and work closely with cross-functional teams to deliver timely analytical results for a wide range of semiconductor and materials characterization projects.
The ideal candidate is a strong technical contributor who enjoys working directly with advanced tools, thrives in a collaborative, fast-paced laboratory environment, and takes pride in delivering results for clients.
What You'll Do
Work Schedule
*5pm-2am, Tuesdays to Saturdays (*Night Shift differential will apply)
Compliance Requirement (ITAR)
This position supports work subject to U.S. export control regulations.
Applicants must meet U.S. Person status as defined by ITAR:
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