Work with Sandisk internal development team for ASIC product test Development, qualification and characterization on J750, J750EXHD.
Work with OSAT CMs for new ASIC product introduction, test program deployment and probe card buyoff.
Test time reduction and Yield improvement of Final Test and Wafer Sort Test.
Develop new test technologies, new probe card designs and new test methodologies to improve test efficiency and reduce test cost
Design and debug probe card related issues with OSAT CM and Probe Card Vendors to optimize the test conditions for probe card efficiency and lifespan improvement
Work with cross functional engineering teams in Line/Qual/RMA related failure analysis and defining corrective actions for test screens
Work with foundry team for Fab process related yield improvement
Work with Assembly team and OSAT assembly house for assembly related yield improvement