Materials Analyst, Microscopy (Dual Beam FIB)

Join our growing Advanced Microscopy team in Phoenix, AZ and help shape the success of our state-of the-art laboratory. We are seeking a Materials Analyst to join our specialized Dual Beam (SEM-FIB) group, supporting advanced materials and semiconductor analysis for clients across a wide range of industries.

This hands-on role focuses on TEM lamella preparation using Dual Beam FIB tools and offers the opportunity to work with cutting-edge instrumentation. As a key member of the team, you will contribute to high-impact client projects by producing quality, site-specific TEM samples that enable advanced failure analysis and materials characterization.

The successful candidate is a strong technical contributor who enjoys working directly with advanced tools, thrives in a collaborative, fast-paced laboratory environment, and takes pride in delivering quality and timely results for clients.

What You’ll Do

A typical day in this role includes:

• Preparinghigh‑quality, site‑specific TEM lamella using Dual Beam FIB‑SEM systems on novel materials and advanced semiconductor devices.
• Performing SEM imaging to support sample navigation, preparation, and quality verification.
• Managing multiple client samples, ensuring adherence to internal quality standards and turnaround commitments.
• Working closely with your team to optimize workflows, improve efficiency, and maintain consistent output.
• Collaborating with internal analytical teams and, as needed, clients to understand analysis requirements and standardized procedures.

Work Schedule: *5pm-2am, Sundays to Thursdays or Tuesdays to Saturdays

*10% night shift differential will apply

Compliance Requirement (ITAR)

This position supports work related to defense applications and is subject to ITAR regulations.

Applicants must be U.S. Persons, defined as:

• U.S. Citizen
• U.S. Permanent Resident (Green Card holder)